Abstract

Abstract—Power gating (PG) is an effective method to reduce leakage currents in an SoC design during run-time. It dynamically shuts down components using a network of sleep transistors, but requires a detailed analysis to scale this network appropriately with respect to area, wake-up time, in-rush currents, voltage drops and transition energies. In this paper, we present a method to efficiently determine these key parameters for any SoC design and sleep transistor network at gate-level to enable the rapid exploration of power design alternatives while providing sufficient accuracy for high-level design exploration. Compared to SPICE our approach achieves a speed-up of up to 11457x for two ISCAS circuits, a 32-bit multiplier and a RISC-V core, each build for a 90nm PDK. The average error compared to SPICE is 2.6% for peak current and 10% for wake-up energy and delay.